With simultaneous ptychography and atomic number contrast imaging we have enhanced the ability to determine the 3D structure of few atomic layer materials at minimal dose using a minimal amount of tilt angles using a few tilt tomography algorithm.

For further details

“Picometer-precision few-tilt ptychotomography of 2D materials”,
C. Hofer, K. Mustonen, V. Skákalová, T. J. Pennycook, 2D Materials 10, 035029 (2023).